These miniature bend, fatigue, strain, compression and tensile testers are designed for use in Scanning Electron Microscopes (SEMs), Atomic Force Microscopes (AFMs) and Light Microscopes (LMs). The dual leadscrew design symmetrically loads samples while keeping them centered within the scopes field of view. 100, 1000 and 2000 pound versions are standard with a wide range of sample clamps, bending fixtures (3 and 4 point) and compression anvils. Custom mounting adapters are available for integration into virtually all major microscopy tools. Optional heaters and thermoelectric heaters are also offered for testing under low and high temperature conditions.
MTII/Fullam offers a unique, compact test system specifically designed to fit inside scanning electron microscopes. Capable of performing fatigue, compression, bending and tensile testing, they are ideal testers for researchers and material scientists. During testing, crack propagation, grain rotation and other effects of mechanical stress can be observed under high magnification in an electron microscope. This provides greater insight into early stages of material failure and a better overall understanding how specific materials perform. To control experiments and collect data, MTII/Fullam uses the MTESTQuattro™ material testing system from ADMET Inc. This powerful package provides a user-friendly interface to set system test parameters and analyze data. Results are provided in real time and stress-strain curves generated while tests are in progress. Key parameters such as peak load/stress, offset yield, modulus of elasticity and other measurements are also reported. Raw test data and results can be exported in standard formats making it easy to integrate with other data analysis and laboratory management systems. MTII/Fullam provides a wide range of custom clamps for virtually all shapes of materials. Quick connect mounting fixtures are also available for seamless integration into most major microscopy tools. Port covers and adapters allow users to install systems without modification to vacuum chambers or microscopes.
Precision Measurement and Material Testing Solutions
Advanced LM, SPM, and SEM Material Tensile Testing Systems
Obtain fast, accurate and reliable information about the mechanical properties of materials with MTII/ Fullam’s SEMtester series of tensile and compression testers. Specifically designed for use in Scanning Electron Microscopes (SEMs), Scanning Probe Microscopes (SPMs) and Light Microscopes (LMs), these miniature tensile testers are ideal for performing experiments under magnification. This provides greater insight into early stages of material failure and a better overall understanding of how specific materials perform. In addition, grain dislocation and crack propagation can be observed in real time, revealing more information about deformation than traditional, post-failure analysis techniques.
MTII/Fullam offers a variety of manual, semi-automated and fully automated platforms to fit any budget. Load frame capacities of 100 lb (450 N), 1000 lb (4500 N) and 2000 lb (9000 N) are standard with selectable load cells to improve accuracy and sensitivity, and to match customer requirements. Extended strain travel versions are available allowing longer, more ductile samples to be tested. Both horizontal and angled specimen clamps provide the flexibility to operate with typical microscopes and EBSDs. Quick-connect mounting adapters are provided and designed for seamless integration into most major microscopy tools. Customized port covers allow users to install systems without modifications to vacuum chambers or microscope platforms.
Intuitive Operating Package:
To control experiments and collect data, MTII/Fullam uses a proprietary Windows®-based control and material testing software system that complies with ASTM specifications. This powerful package provides a user-friendly interface to set system test parameters and analyze data. Specimen dimensions are defined along with strain rates and thresholds (load, elongation, time), which are then used to perform automated tests and calculations. These parameters are stored as “recipes” that can be called upon again for future experiments. Results are provided in real time and stress-strain curves generated while testing is in progress. Key parameters such as peak load/stress, offset yield, modulus of elasticity and other measurements are reported. Raw test data and results can be exported in standard formats, making it easy to integrate with other data analysis and laboratory management systems.
The SEMtester line of products is capable of performing tensile, compression, bending, creep and fatigue testing on a variety of materials. Deformation and relaxation behavior can be observed under dynamic or static loading. Optional sample heaters or thermoelectric heaters can be used during testing to simulate actual operating conditions.
A variety of specimen clamps are available to accept virtually any sample configuration. This versatility makes the SEMtester product line suitable for testing a range of materials:
Options and Accessories:
Since not all applications are alike, instruments used in research and development environments must be flexible and easily configured for different tests. That’s why MTII/Fullam offers a variety of options and accessories to meet our customers’ changing requirements. Whether it’s a basic manual tester or a completely automated servo control and data acquisition package, we have a solution to fit your needs.
MTII/Fullam offers a number of standard and custom options including the following:
MTI Instruments Inc.
325 Washington Avenue Extension
Albany, NY 12205-5505 USA
Toll Free (US): 800-342-2203