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TENSILE, COMPRESSION AND BEND TESTING MACHINES

Tensile, Compression and Bending Systems

TENSILE, COMPRESSION AND BEND TESTING MACHINES 

MTII recently acquired the Fullam brand of miniature tensile, compression and bend testing machines specifically designed for use in Scanning Electron Microscopes (SEM’s), Atomic Force Microscopes (AFM’s) and Light Microscopes (LM’s). The dual leadscrew design symmetrically loads samples while keeping them centered within the scope’s field of view. 100 and 1000 pound versions are standard with a wide range of sample clamps, bending fixtures (3 and 4 point) and compression anvils. Custom mounting adapters are available for integration into virtually all major microscopy tools. Optional heaters and thermoelectric heaters/coolers are also offered for testing under low and high temperature conditions.

MTII/Fullam offers a unique, compact test system specifically designed to fit inside scanning electron microscopes. Capable of performing tensile, compression, bending and fatigue tests, they are ideal tools for researchers and material scientists. During testing, crack propagation, grain rotation and other effects of mechanical stress can be observed under high magnification in an electron microscope. This provides greater insight into early stages of material failure and a better overall understanding how specific materials perform. To control experiments and collect data, MTII/Fullam uses the MTESTQuattro™ material testing system from ADMET Inc. This powerful package provides a user-friendly interface to set system test parameters and analyze data. Results are provided in real time and stress-strain curves generated while tests are in progress. Key parameters such as peak load/stress, offset yield, modulus of elasticity and other measurements are also reported. Raw test data and results can be exported in standard formats making it easy to integrate with other data analysis and laboratory management systems. MTII/Fullam provides a wide range of custom clamps for virtually all shapes of materials. Quick connect mounting fixtures are also available for seamless integration into most major microscopy tools. Port covers and adapters allow users to install systems without modification to vacuum chambers or microscopes.

  • Tensile, compression and bend testing
  • Provides monotonic, segmented and cyclic testing in tension or compression
  • Samples tested include metals, composites, polymers, elastomers, wood fibers, hair, recording tape, threads and fabrics, cookie dough, concrete, ceramics, carbon fibers and more
  • Nuclear accerator and X-Ray diffraction versions available
  • Special EBSD versions available with 70 degree sample tilt
  • Compact, computer controlled load frame fits inside microscope chamber
  • Lightweight aluminum alloy construction
  • Internal motor drive
  • Computer controlled
  • Non-magnetic, vacuum-compatible components
  • Ball bearing design
  • Adaptable to most microscopes
  • Widely understood materials testing software
  • Quick, easy installation
  • No microscope alterations required
  • Optional heaters/coolers, specimen clamps and bending fixtures
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MTI Instruments Inc.
325 Washington Avenue Extension
Albany, NY 12205-5505 USA
Phone: 518-218-2550
Toll Free (US): 800-342-2203
Fax: 518-218-2506
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