Mechanical Technology, Incorporated

Semiconductor Metrology System

Undoubtedly an essential measurement tool for process automation, quality control and tool automation control.

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Measures all wafer materials including Silicon, Gallium-Arsenide*, Indium-Phosphide and those mounted to sapphire or tape.

This manual, non-contact measurement system is for wafer thickness, TTV, and bow. Using MTI's proprietary non-contact capacitance probes, the Proforma 300i is fast, accurate and reliable.The Proforma 300i measures all wafer materials including Silicon, Gallium-Arsenide*, Indium-Phosphide and those mounted to sapphire or tape.

Semiconductor Metrology System

Features

  • Front USB port enables easy data storage to flash drives
  • MTI Instruments' Proprietary Capacitance Circuitry for Outstanding Accuracy and Dependability
  • Non-contact Measurements
  • 76-300 mm Diameter Wafer Range

If your application requires large volume sensors Click Here for Custom Solutions

Technology Principles

At MTI Instruments, we offer advanced sensing and physical measurement technology in products that range from basic sensors to complete, fully integrated measurement systems.

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If your application requires large volume sensors Click Here for Custom Solutions

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