This manual, non-contact measurement system is for wafer thickness, TTV, and bow. Using MTI's proprietary non-contact capacitance probes, the Proforma 300i is fast, accurate and reliable.The Proforma 300i measures all wafer materials including Silicon, Gallium-Arsenide*, Indium-Phosphide and those mounted to sapphire or tape.
Looking for similar or complementary products? Browse the following products.
The Accumeasure MicroCap is a compact, custom designed, OEM capacitance system for high-precision non-contact measurement. It provides exceptional value and offers sub-nanometer resolution, extremely high stability and fast response time, making…View Product
The Accumeasure 500 compact capacitance rack system accepts up to 6 standard or MTII’s proprietary push/pull capacitance amplifiers. The modular design allows customers to populate the rack with their required number of measurement channels…View Product
The Accumeasure D series amplifier is a truly new revolutionary design that uses the latest technology to convert a highly reliable capacitive electric field measurement (displacement) directly into a highly precise 24 bit digital reading. The…View Product
The Microtrak™ 4 is the best laser sensor for measuring height, thickness, displacement, vibration, and more... The Microtrak 4 provide data output and power through a single USB cable. With a sensor frame rate of 40kS/sec. and linearity…View Product
High-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.View Product