Photovoltaic/Solar Metrology System
For in-process monitoring of solar/photovoltaic wafers
Multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
High-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
- Up to three thickness channels per rack
- Proprietary MTII push/pull capacitance probes work with all wafer types
- Minimum, maximum, average and total thickness variation measurements
- Bow measurement (3 probe pairs required)
- Integrated data aquisition and control electronics
- Fast Ethernet communications ports for production rates up to 5 wafers per second
- Scalable for increased number of thickness line scans
- Digital I/O for interface with existing wafer handling equipment
- Windows® based control program for local or remote data monitoring
- Windows® based DLL package for integration with existing control PC’s
- Standard and custom probe sizes available
|Product Info||Technical Specifications|
|P/N||Model||Measurement Range||Stand-Off||Interface||Type||Request Info|
|8000-4316-001||PV-1000 Thickness System -1||Select PP Probes||Select PP Probes||Ethernet||up to 6 Channel Rack||Request Infomation on PV-1000 Thickness System -1|
|8000-4316-002||PV-1000 Thickness System -2||Select PP Probes||Select PP Probes||Ethernet||up to 6 Channel Rack||Request Infomation on PV-1000 Thickness System -2|
|8000-4316-003||PV-1000 Thickness System -3||Select PP Probes||Select PP Probes||Ethernet||up to 6 Channel Rack||Request Infomation on PV-1000 Thickness System -3|
|Not finding what you’re looking for? MTI offers custom solutions More Info About MTI’s Custom Solutions|
At MTI Instruments, we offer advanced sensing and physical measurement technology in products that range from basic sensors to complete, fully integrated measurement systems.
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