Photovoltaic/Solar | Metrology System

>>>>Photovoltaic/Solar | Metrology System
Photovoltaic/Solar | Metrology System 2017-10-17T07:31:53+00:00

Photovoltaic/Solar | Metrology System

Undoubtedly an essential measurement tool for process automation, quality control and tool automation control.

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Multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.

High-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.

Features

  • Up to three thickness channels per rack
  • Proprietary MTII push/pull capacitance probes work with all wafer types
  • Minimum, maximum, average and total thickness variation measurements
  • Bow measurement (3 probe pairs required)
  • Integrated data aquisition and control electronics
  • Fast Ethernet communications ports for production rates up to 5 wafers per second
  • Scalable for increased number of thickness line scans
  • Digital I/O for interface with existing wafer handling equipment
  • Windows® based control program for local or remote data monitoring
  • Windows® based DLL package for integration with existing control PC’s
  • Standard and custom probe sizes available

Model Specifications

Product Info Technical Specifications
P/N Model Measurement Range Stand-Off Interface Type Request Info
8000-4316-001 PV-1000 Thickness System -1 Select PP Probes Select PP Probes Ethernet up to 6 Channel Rack Request Infomation on PV-1000 Thickness System -1
8000-4316-002 PV-1000 Thickness System -2 Select PP Probes Select PP Probes Ethernet up to 6 Channel Rack Request Infomation on PV-1000 Thickness System -2
8000-4316-003 PV-1000 Thickness System -3 Select PP Probes Select PP Probes Ethernet up to 6 Channel Rack Request Infomation on PV-1000 Thickness System -3
Not finding what you’re looking for? MTI offers custom solutions More Info About MTI’s Custom Solutions

Industries & Applications For This Product

Industry Measurement Type Applications
Solar Metrology Wafer Bow and Warp

Brochures

Photovoltaic/Solar | Metrology System Brochure

Required Accessories

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Accessories

Technology Principles

At MTI Instruments, we offer advanced sensing and physical measurement technology in products that range from basic sensors to complete, fully integrated measurement systems.

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