Tensile Systems

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Tensile Systems 2018-02-02T21:40:29+00:00

Tensile Systems

Miniature Tensile Tester

SEM-based Tensile Systems

SEM-based Tensile Systems

These in-situ miniature bend, fatigue, strain, and tensile testers are designed for use in Scanning Electron Microscopes (SEMs), and Light Microscopes (LMs).
AFM-based Tensile Systems

AFM-based Tensile Systems

Specifically designed to fit under AFMs, these MicroTensile Testers provide high resolution tensile, compression, fatigue and bend testing of up to 450N (100 lbs.). Used in-situ or stand-alone, it weighs only about 750 grams, these MicroStage testers are also ideal for use on air tables.

MTI Tensile systems cover wide range of load capabilities with a flexible design for use in many of the most popular Scanning Electron Microscopes (SEMs), Light Microscopes (LMs), and Atomic Force Microscopes (AFMs). Load Frame ranges include 100 pound (450 N), 1,000 pound (4,500 N), and 2,000 pound (9,000 N). The dual lead-screw design symmetrically works the samples while keeping the deformation zone centered in any scopes field of view.

A variety of interchangeable clamps, grips, and anvils are available for working samples & specimens in both Tension and Compression. With the addition of a contact heater, sample temperatures up to 900 C can be achieved. Control and data collection is done through a unique Digital Acquisition System and its accompanying intuitive software package.